Presented at the ATP Innovations in Testing 2023 Conference

Detection and prevention of item bias has been researched and discussed for years; however, advancements in and increased awareness of diversity in society has caused the testing industry to revisit the effectiveness of bias review processes. The purpose of this panel discussion is to bridge the classical item bias review processes of the past with current practices and concerns of today. The panel will include experts from different professional testing organizations and a psychometrician. During the first half of the session, the panelists will discuss: 1) changes DEIA have brought to the item development process; 2) effective item bias review methods; and 3) psychometric best practices and statistical methods for detecting item bias. The second half of the session will focus on questions from the audience. Attendees will leave this session with a better understanding of how item bias may unknowingly occur in their exams and ways to both prevent it and address it.


  • Jared Zurn, National Council of Architectural Registration Boards
  • Emily Yunker, Physician Assistant Education Association
  • Amanda Wolkowitz, Data Recognition Corporation
  • Susan Cooley, Alpine Testing Solutions
  • Brett Foley, Alpine Testing Solutions

To view the slides from this session, click the button below:

To learn more about the ATP Innovations in Testing 2023 Conference, click here.